材料表征原版系列丛书：有机薄膜的表征

作者：（美国）布伦德尔（C.RichardBrundle）（美国）埃文斯（CharlesA.Evans）（美国）乌尔曼（AbrahamUlman）乌尔曼（AbrahamUlman），Analyticaltoolsforthestudyoforganicthinfilmshaveseendramaticdevelopmentsinthelastdecade.Usingsuchtoolsithasbecomepossibletoobtainstructuralinformationatthemolecularlevelandthustorelatematerialsstructuretomaterialsproperties.CharacterizationofOrganicThinFilmswillhelpmaterialsscientists，physicists，chemists，andbiologistsdevelopafundamentalunderstandingofstructure—propertiesrelationshipswhichinturnmakespossiblemolecularengineeringofadvancedmaterialsandopensnewopportunitiesinmolecularmanufacturing.Thisvolumebeginswithintroduc—torychaptersonLangmuir—Blodgettandself—assembledfilms，andcontinueswiththediscussionoftheirpropertiesasstudiedbydifferentanalyticaltech—niques.Boththeirsurface/interfacialandbulkpropertiesarecovered.